- L.C. Feldman, J.W. Mayer, 'Fundamentals of Surface and Thin Film Analysis', North Holland 1986.
- J.R. Tesmer, M. Nastasi, 'Handbook of Modern Ion Beam Materials Analysis', MRS, Pittsburgh 1995.
- W.K. Chu, J.W. Mayer, M.A. Nicolet, 'Backscattering Spectrometry', Academic Press 1978.
- J.F. Ziegler, J.P. Biersack, and U. Littmark, 'The Stopping and Range of Ions in Solids', Pergamon Press, New York, 1985.
- L.C. Feldman, J.W. Mayer, S.T. Picraux, 'Materials Analysis by Ion Channeling', Academic Press 1982. Google Scholar
- Ion stopping and range calculation by TRIM/SRIM: http://www.srim.org
- SIMNRA: https://home.mpcdf.mpg.de/~mam/
- RBS analysis tutorial by Charles Evans: http://www.cea.com/cai/rbstheo/cairtheo.htm
- M. Mayer, Rutherford Backscattering Spectrometry (RBS):users.ictp.it/~pub_off/lectures/lns022/Mayer_1/Mayer_1.pdf
- M. Mayer, Nuclear Reaction Analysis (NRA):citeseerx.ist.psu.edu/viewdoc/download?doi=10.1.1.618...
- http://www.physics.uwo.ca/~lgonchar/research/links/June3_2013/RBS_June3_2013_slides.pdf